Observation of Single Event Upsets in Analog Microcircuits

Abstract

Selected analog devices were tested for heavy ion induced single event upset (SEU). The results of these tests are presented, likely upset mechanisms are discussed, and standards for the characterization of analog upsets are suggested. The OP-15 operational amplifier, which was found to be susceptible to SEU in the laboratory, has also experienced upset in space. Possible strategies for mitigating the occurrence of analog SEUs in space are discussed.

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Document Details

Document Type
Technical Report
Publication Date
Jan 15, 1998
Accession Number
ADA348978

Entities

People

  • D. C. Mayer
  • Rokutano Koga
  • S. C. Moss
  • S. D. LaLumondiere
  • S. D. Pinkerton
  • S. J. Hansel

Organizations

  • The Aerospace Corporation

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Air Force
  • Air Force Facilities
  • Amplifiers
  • Amplitude
  • Circuits
  • Corporations
  • Detectors
  • Digital Circuits
  • Electronics
  • Field Effect Transistors
  • Laser Beams
  • Lasers
  • Microcircuits
  • Operational Amplifiers
  • Space Systems
  • Standards
  • Test Equipment

Fields of Study

  • Physics

Readers

  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Space