An Expert System for Design of Plastic Integrated Circuit Packages Against Latent Moisture Induced Defects. Phase II
Abstract
This program examined the feasibility of developing a model for predicting cracking of plastic integrated circuit packages. It was demonstrated that moisture induced hydro-thermal stresses during soldering operations can cause plastic package cracking or "pop coming." A crack propagation model was developed using fracture mechanics parameters coupled with hydrostatic stresses. Selected plastic packages were characterized using the developed model and segregated according to crack susceptibility during a solder reflow process. Model results compared favorably with laboratory testing on actual parts. Also developed was a computer based expert system that incorporates the crack prediction model.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 01, 1998
- Accession Number
- ADA349682
Entities
People
- An-yu Kuo
- Kuan-luen Chen
- Luu T. Nguyen