Dynamic Fault Collapsing and Diagnostic Test Pattern Generation for Sequential Circuits

Abstract

In this paper, we present results for significantly improving the performance of sequential circuit diagnostic test pattern generation (DATPG). Our improvements are achieved by developing results that permit dynamic, fully functional, collapsing of candidate faults. Fault collapsing permits the organization of faults into disjoint partitions based on the indistinguishability relation. These results are used to develop a diagnostic test pattern generation algorithm that has the same order of complexity as that of detection oriented test generation (ATPG). Techniques to identify untestable faults, based on exploiting indistinguishability identification, are also presented. Experimental results are presented on the ISCAS 89 benchmark circuits.

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Document Details

Document Type
Technical Report
Publication Date
Nov 01, 1998
Accession Number
ADA351548

Entities

People

  • Vamsi Boppana
  • W. Kent Fuchs

Organizations

  • Purdue University

Tags

DTIC Thesaurus Topics

  • Algorithms
  • Computations
  • Computer-Aided Design
  • Computers
  • Demographic Cohorts
  • Detection
  • Electrical Engineering
  • Engineering
  • Generators
  • Identification
  • Military Research
  • Observation
  • Sequences
  • Set Theory
  • Simulations
  • Simulators
  • Technical Information Centers

Fields of Study

  • Computer science

Readers

  • Applied Combinatorial Optimization and Logic Circuit Design.
  • Software Engineering