ESREF 98 - 9th European Symposium on Reliability of Electron Devices, Failure Physics and Analysis

Abstract

The Final Proceedings for ESREF 98 - 9th European Symposium on Reliability of Electron Devices from 5 October to 9 October 1998. This is an interdisciplinary conference. Topics include reliability of electron devices, including MEMs, failure physics and analysis.

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Document Details

Document Type
Technical Report
Publication Date
Oct 19, 1998
Accession Number
ADA356245

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Chemical Synthesis
  • Chemistry
  • Computational Science
  • Electromagnetic Fields
  • Electronics Industry
  • Electronics Laboratories
  • Material Degradation Processes
  • Materials Processing
  • Materials Science
  • Materials Testing
  • Mechanics
  • Modules (Electronics)
  • Network Science
  • Optics
  • Power Electronics
  • Quantum Yields
  • Semiconductors

Fields of Study

  • Engineering

Readers

  • Academic Conference Management
  • Pulsed Power and Plasma Physics.
  • Trauma or Military Medicine

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems