Instrumentation Facility for the Evaluation, Testing, and Packaging of Polymer Materials and Devices for Integrated Optical Circuits and Photonic Systems

Abstract

This report describes the instrumentation facilities now available for the evaluation of new polymer materials for photonics and the measurement of polymer photonic devices. This new instrumentation was purchased and constructed using the funds from this DURIP Grant. The new facilities include attenuated total reflection and ellipsometric instrumentation for the measurement of electro-optic coefficients. Instrumentation for the measurement of thin film waveguide loss and material index of refraction by spectroscopic ellipsometery are also available. The high speed characterization of polymer devices using pico-second pulses at a wavelength of 1550 nm are now possible with this instrumentation.

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Document Details

Document Type
Technical Report
Publication Date
Dec 31, 1998
Accession Number
ADA359204

Entities

People

  • William Steier

Organizations

  • University of Southern California

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Coefficients
  • Electrical Engineering
  • Electro-Optic Modulators
  • Films
  • Instrumentation
  • Materials
  • Materials Science
  • Measurement
  • Measuring Instruments
  • Optical Circuits
  • Optical Materials
  • Optics
  • Photonic Devices
  • Photonic Integrated Circuits
  • Photonics
  • Refractive Index
  • Thin Films

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
  • Research Science/Academic Research