Use of Principal Component Analysis for the Identification and Mapping of Phases from Energy-Dispersive X-Ray Spectra

Abstract

Multivariate statistical analysis methods such as Principal Component Analysis (PCA) are now finding applications in electron microscopy including the analysis of energy dispersive x-ray spectra (EDS). The aim in this thesis is to extend EDS beyond its conventional use in the measurement of elemental distributions to allow both the identification of chemical phases and the mapping of their distribution. In the present work, PCA was applied to the analysis of modeled spectra representing interfaces where diffusion and/or an interface reaction had occurred. A search routine was developed to find physically possible interface phases using the principal components found by PCA. From the modeled data, it was shown that an interface phase could, in principle, be found using PCA but that it is embedded in a cluster of physically possible spectra. The technique was then applied to experimental data obtained from an interface between chemically vapor deposited diamond (CVDD) and Cr2O3. The results followed the same pattern as was seen with the modeled data. Criteria for experimental EDS spectra other than those used to define a physically meaningful spectrum are discussed. These should help further limit the cluster of possible answers found allowing a correct determination of the real interface phase.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1999
Accession Number
ADA359572

Entities

People

  • Daniel J. Chisholm

Organizations

  • Naval Postgraduate School

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Auger Electrons
  • Coordinate Systems
  • Data Science
  • Detectors
  • Electron Microscopes
  • Electron Microscopy
  • Experimental Data
  • Factor Analysis
  • Information Science
  • Materials
  • Materials Science
  • Mechanical Engineering
  • Spectra
  • Spectroscopy
  • Statistical Analysis
  • X Ray Spectra
  • X Rays

Readers

  • Neural Network Machine Learning.
  • Regression Analysis.
  • Software Engineering

Technology Areas

  • Microelectronics