Optimization of a Multilayer Photothermal Sensor for Infrared Spectroscopy

Abstract

Tri-layer thermal diffusion modeling was applied to the optimization of a multi-layer reed sensor for use in a photothermal infrared detector. The multi-layer reed sensor deflects in response to increased temperature. Deflection, of angstroms or larger, is measured using an atomic force microscope. A newly developed thermal diffusion model for three layer reeds was combined with an existing two-layer cantilever model, in order to explore the effects of length, operating frequency, and layer thickness on signal to noise ratio. Model behavior is presented, and compared to laboratory results.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 1999
Accession Number
ADA361427

Entities

People

  • Janine O. Wiggins

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Advanced Electronics
  • Sensors

DTIC Thesaurus Topics

  • Air Force
  • Climate Change
  • Detection
  • Detectors
  • Diffusion
  • Frequency
  • Geometry
  • Heat Transfer
  • Infrared Spectroscopy
  • Lasers
  • Measurement
  • Modulus Of Elasticity
  • Resonant Frequency
  • Spectroscopy
  • Thermal Conductivity
  • Thermal Diffusion
  • Three Dimensional

Readers

  • Computational Modeling and Simulation
  • Nanofabrication and Microfabrication.
  • Optical Physics and Photonics.