A Progress Report on X-Ray Diffraction Measurements on New Low-Thermal Conductivity Thermoelectric Materials

Abstract

Thermoelectric devices and materials have potential applications in refrigeration and power generation. An X-ray diffraction study was made documenting the phase and the lattice parameter of both some new thermoelectric compounds and some previously known compositions. The materials contained primarily Ir, Rh, Sb, Sn, and Pt. Improvements in the measurement procedures resulted in improved accuracy in lattice parameter measurements and in peak intensity measurements.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 1999
Accession Number
ADA362756

Entities

People

  • Anne P. Hynes
  • Glen A. Slack
  • Sabrina L. Lee
  • Sandra L. Schujman

Organizations

  • United States Army Armament Research, Development and Engineering Center

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Weapons Technologies

DTIC Thesaurus Topics

  • Accuracy
  • Calibration
  • Conductivity
  • Data Analysis
  • Diffraction
  • Engineering
  • Hot Pressing
  • Intensity
  • Materials
  • Materials Laboratories
  • Measurement
  • Radiation
  • Semiconductors
  • Standards
  • Thermal Conductivity
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Materials science

Readers

  • Nanofabrication and Microfabrication.
  • Solar Photovoltaics and Thermoelectric Devices.
  • Thermal Physics or Thermal Science.