The Detection of Doped Cr Presence in Sr(0.6)Ba(0.4)Nb2O3 by SIMS

Abstract

Photorefractive materials like SrBaNb (SBN) have optical properties that can have several military applications. To improve the figures of merit for these materials, it is very important to have better control of Cr dopant in the SBN. Since the amount of Cr dopant is so small, the usual analytical techniques are not adequate to analyze this material. In this report, the incorporation of Cr into SBN using secondary ion mass spectrometry (SIMS) measurement with an electron gun is confirmed.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
May 01, 1999
Accession Number
ADA363575

Entities

People

  • Unchul Lee

Organizations

  • United States Army Research Laboratory

Tags

Communities of Interest

  • Energy and Power Technologies
  • Sensors

DTIC Thesaurus Topics

  • Electron Beams
  • Electron Guns
  • Electronic Equipment
  • Electrons
  • Energy Bands
  • Ion Beams
  • Ions
  • Isotopes
  • Mass
  • Mass Spectrometers
  • Mass Spectrometry
  • Materials
  • Measurement
  • Military Applications
  • Military Research
  • Spectrometers
  • Spectrometry

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Oncology and Biomarker-Based Cancer Detection.
  • Powder metallurgy of Titanium alloys.

Technology Areas

  • Microelectronics