Measurement of the Dielectric Strength of Quartz Crystalline Material,

Abstract

The dielectric strength of a sample of a 0.5-mm-thick quartz wafer was measured to be 1.9 MV/cm.

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Document Details

Document Type
Technical Report
Publication Date
Jul 14, 1999
Accession Number
ADA365869

Entities

People

  • David C. Wu
  • Dieter R. Lohrmann

Organizations

  • United States Naval Research Laboratory

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Diameters
  • Dielectric Strength
  • Dielectrics
  • Dioxides
  • Electric Fields
  • Electricity
  • Electronic Warfare
  • Energy Storage
  • High Power Microwaves
  • High Voltage
  • Materials
  • Materials Processing
  • Measurement
  • Military Research
  • Silicon Dioxide
  • Voltage
  • Voltmeters

Fields of Study

  • Physics