Free-Space Electro-Optic Sampling and 2D THZ Imaging
Abstract
Ultrafast electrooptic sampling technique, which is primarily used for local electric field characterization in integrated circuits, has been applied to free space applications. Electrooptic sampling for characterizing freely propagating terahertz beams has been demonstrated with femtosecond temporal resolution and sub-micro V sensitivity. We also achieved real time 2D THz imaging with parallel optical reconstruction with a CCD camera We also developed an electrooptic THz streak camera.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 31, 1999
- Accession Number
- ADA369995
Entities
People
- X.-C. Zhang
Organizations
- Rensselaer Polytechnic Institute