Vapor Pressure of VX
Abstract
O-ethyl-S-(diisopropylaminoethly) methyl phosphonothiolate (VX) vapor pressure has been measured using a modified ASTM method in which a carrier gas was slowly passed over the liquid phase, and the saturated effluent was analyzed. Data measured in the current work has extended the low end of the range of measured VX vapor pressures from 30 to -13 deg C, which represents well over two orders of magnitude lower VX vapor pressure than previously documented and provides a direct assessment of VX volatility over a majority of the ambient range for the first time.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 1999
- Accession Number
- ADA371297
Entities
People
- Ann B. Butrow
- David E. Tevault
- James H. Buchanan
- Leonard C. Buettner
Organizations
- Edgewood Chemical Biological Center