Dielectric Relaxation Spectroscopy of Adhesively Bonded Joints
Abstract
Prior to any microcracking or delamination in an adhesive bond, an aggressive hygrothermal environment can cause molecular level, chemical and/or physical changes to the adhesive itself. This program was aimed at identifying the changes in the adhesive by the non-destructive test technique known as dielectric relaxation spectroscopy. In addition to identifying the changes in the adhesive by non-destructive techniques, the program was also aimed at determining the changes in the mechanical properties of an adhesive joint resulting from different levels of environmental exposure. These results were then to be correlated to the results obtained by the dielectric spectroscopy technique.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 01, 1999
- Accession Number
- ADA371559
Entities
People
- Naveen Rastogi
- Patricia L. Stumpff
- Rajesh K. Tiwari