Study of Photorefractive Effects in Periodically-Poled Lithium Niobate.
Abstract
The objective of this DURIP-97 program was to facilitate investigation of photo-refractive effects in periodically poled lithium niobate (PPLN). Performance limitations due to photo-refractivity were studied using photo-thermal common-path interferometry (PCI) to determine if photo-refractive damage sensitivity is dependent on grating duty cycle. The PCI technique operates in a "pump-probe" configuration, and is sensitive to both linear optical absorption at the ppm/cm level and photo-refraction. Bulk and waveguide frequency doubling PPLN modules having a range of grating pitches were fabricated by Corporation. In the bulk PPLN devices, optimum performance was found in modules with a nominal duty cycle close to the 50% value predicted by assuming that photo-refraction in lithium niobate is caused by photo-galvanic charge separation and that the alternating ferroelectric domain polarity due to the grating acts to "short-circuit" any charge build-up. Similar optimum performance is expected from waveguide harmonic conversion devices which have 40-50% duty cycles.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 1999
- Accession Number
- ADA372478
Entities
People
- A. Alexandrovski
- M. M. Fejer
- R. K. Route
Organizations
- Stanford University