A Study of Near and Far Field Effects in Photoelastic Stress Intensity Determination

Abstract

A technique known as the Taylor Series Correction Method (TSCM) for extracting the stress intensity factor from photoelastic data is reviewed. The need for "artificial" flaws is identified and an approach due to Savin is used to evaluate the near field effects of various practical artificial flaw shapes upon the apparent stress intensity factor. Using the Sneddon-Srivastav solution for a line crack in a finite width plate, the constriction of the singular zone is demonstrated as the crack tip approaches the free edge.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Jul 01, 1974
Accession Number
ADA373986

Entities

People

  • C. W. Smith
  • M. A. Schroedl

Organizations

  • Virginia Tech

Tags

Communities of Interest

  • Air Platforms
  • C4I
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Bessel Functions
  • Boundaries
  • Coefficients
  • Complex Variables
  • Computer Programs
  • Crack Tips
  • Curvature
  • Engineering
  • Equations
  • Geometry
  • Integral Equations
  • Materials
  • Mechanics
  • Near Field
  • New York
  • Notch Sensitivity
  • Stress Intensity Factors

Readers

  • Calculus or Mathematical Analysis
  • Structural Health Monitoring of Composite Structures.