Quantitative Energy Dispersive X-Ray Spectrometry Using an Emispec Vision System

Abstract

The purpose of this work was to investigate the use of an Emispec Vision system to analyze energy dispersive x-ray spectra (EDS) obtained with the Topcon 002B transmission electron microscope (TEM) in the Materials Science Laboratory at the Naval Postgraduate School. A series of tests performed with a standard NiO sample revealed that the TEM column and EDS detector were operating in a satisfactory fashion. NiO spectra acquired with different sample tilt-angles were used to test the Emispec software. An improved setup configuration, in which accurate quantification is obtained with the sample at zero tilt-angle, was developed. Quantification tests performed with TiO2, Cu-Al2O3 and alumina-YAG (with 2.5% TiO2) samples confirmed the accuracy of the new software setup. Line profiles across the alumina-YAG interfaces were also recorded to verify the performance of the Emispec system for spectrum profile acquisition and to investigate the Ti distribution at the interface of the alumina-YAG heat-treated sample.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 1999
Accession Number
ADA374498

Entities

People

  • Carlos A. Kasemodel

Organizations

  • Naval Postgraduate School

Tags

DTIC Thesaurus Topics

  • Acquisition
  • Chemistry
  • Detectors
  • Diffraction
  • Electromagnetic Radiation
  • Electron Microscopes
  • Electron Microscopy
  • Electrons
  • Materials Science
  • Microscopes
  • Microscopy
  • Radiation
  • Scattering
  • Spectra
  • Spectrometry
  • Transmission Electron Microscopy
  • X Rays

Fields of Study

  • Physics

Readers

  • Distributed Systems and Data Platform Development
  • Powder metallurgy of Titanium alloys.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems