Dielectric Properties of PMN-PZ-PT System

Abstract

Recently, there has been considerable scientific and technological interest in ferroelectric thin films for numerous potential applications that utilize their dielectric, piezoelectric, pyroelectric and electro-optic properties. Among them, lead zirconate titanate (PZT) and PZT-Pb(Mg1/3Nb2/3)O3 systems at compositions near their morphotrophic phase boundaries, have been investigated because of their excellent piezoelectric and dielectric properties for actuator and semiconducting memory devices. In this study, ferroelectric thin films with 0.1Pb(Mg1/3Nb2/3)O3-0.9Pb(ZrxTi(1-x))O3 (0.3 <= x <= 0.9) composition have been prepared by chemical solution deposition with corresponding metal alkoxides partially stabilized with triethanolamine and acetylacetone. 0.1Pb(Mg1/3Nb2/3)O3-0.9Pb(ZrxTi(1-x))O3 thin films were deposited on Pt-coated substrate by spin-coating and crystallized at 700 deg C in air. And then their dielectric properties were investigated.

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Document Details

Document Type
Technical Report
Publication Date
Feb 28, 2000
Accession Number
ADA374671

Entities

People

  • Ki H. Yoon

Organizations

  • Yonsei University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Advanced Materials
  • Boundaries
  • Chemistry
  • Coatings
  • Dielectric Permittivity
  • Dielectric Properties
  • Films
  • Frequency
  • Lead Zirconate Titanates
  • Materials
  • Materials Processing
  • Materials Science
  • Microstructure
  • Spin Coatings
  • Substrates
  • Thin Films
  • Titanates

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Organic Chemistry
  • Thin Film Deposition Science.