High Purity ZnS/Ge Interference Filter Emittance

Abstract

Data are presented that demonstrate infrared thin film interference filters made with CVD zinc sulfide start materials exhibit significantly higher spectral emittance than those made with IRTRAN II. A simple radiometric model and comparative analysis are discussed that indicates elevated filter emittance levels may adversely impact infrared sensors and seekers designed to operate in the 7 - 15 micron region. It is expected that systems that incorporate filters made with CVD ZnS could exhibit anomalous high backgrounds, image blurring or optical cross talk.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 1999
Accession Number
ADA376584

Entities

People

  • Clyde Elliott
  • Jon Fisher
  • Russel E. Clement

Organizations

  • Naval Information Warfare Systems Command

Tags

Communities of Interest

  • Advanced Electronics
  • Air Platforms
  • Sensors
  • Weapons Technologies

DTIC Thesaurus Topics

  • Arrays
  • Ballistic Missiles
  • Compound Semiconductors
  • Department Of Defense
  • Detectors
  • Emittance
  • Films
  • Focal Plane Arrays
  • Focal Planes
  • Infrared Detectors
  • Materials
  • Optical Properties
  • Radiation
  • Spectral Emittance
  • Test Methods
  • Thin Films
  • Transmittance

Fields of Study

  • Physics

Readers

  • Image Processing and Computer Vision.
  • Spectroscopy.
  • Surface Engineering/Surface Coating Technology.