The Research of Structural Models of Fatigue Damage of Mixture Films
Abstract
This report results from a contract tasking Physical-Technical Institute, Scientific as follows: The contractor will develop mathematical models connecting an electric resistance change of semiconductor mixture films with the number of loading cycles. Research the damage mechanisms that are dictated by the mixture medium response and sensitive element performance. Develop a fatigue damage model of semiconductor mixture films for irreversible random deformation. Develop principles to predict irreversible aerospace structural characteristics under mechanical loads.
Document Details
- Document Type
- Technical Report
- Publication Date
- Aug 05, 1996
- Accession Number
- ADA380171
Entities
People
- Sezgir H. Shamirzaev