Thermionic Cooling Devices

Abstract

The work functions of Au and Nb films with and without O2 implantation and with Cs film coatings were measured Work functions with values in the range of 1.2-1.3 eV on Nb and Au surfaces coated with Cs were measured. A series of micromachined silicon device structures which featured silicon nitride membranes and fixed pyramidal tips suitable for measuring thermionic currents were fabricated. Numerical predictions for tunneling, field emission and thermionic emission as a function of electrode work function, bias voltages, and electrode gaps made using Simmons model showed that thermionic cooling should be achievable with reasonable parameters. However an error of a factor of 1/2 was found in Simmon's calculation of the image-charge correction to the barrier height which reduces the requirement for the work function from about 1.3eV to about 0.9-1.0eV. No evidence for thermionic currents was observed using Au and Pt electrodes with or without Cs overlayers as expected for the experimental conditions with the modeling based upon the corrected formula.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Aug 01, 2000
Accession Number
ADA380668

Entities

People

  • Theodore H. Geballe
  • Thomas Kenny

Organizations

  • Stanford University

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Advanced Materials
  • Ceramic Materials
  • Electrodes
  • Emission
  • Fabrication
  • Field Emission
  • Materials
  • Measurement
  • Mechanical Engineering
  • Microelectromechanical Systems
  • Microstructure
  • Military Research
  • Quantum Tunneling
  • Thermionic Emission
  • Tunneling
  • Universities
  • Work Functions

Fields of Study

  • Materials science
  • Physics

Readers

  • Electronics Engineering
  • Materials Science and Engineering.
  • Semiconductor Device Technology