Effect of Size on Tensile Strength of Fine Polycrystalline Nickel Wires
Abstract
Small-diameter (250 to 10 microns) polycrystalline nickel wires were prepared from single crystals and tested to relate tensile properties to wire size. Four conditions were tested: cold-drawn; drawn and electropolished; drawn and recrystallized; and drawn, recrystallized, and electropolished. The drawn wires were tested as a function of wire diameter, and recrystallized wires were tested at two grain sizes. The 0.2 percent yield strengths and tensile strengths of cold-drawn wires varied inversely as the square root of wire diameter. The tensile strength of recrystallized wires was diameter independent. The proportional limit stress of recrystallized wires was inversely related to power functions of wire diameter and grain size. This relation can be expressed by a modified Hall-Petch equation.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jan 01, 1966
- Accession Number
- ADA382553
Entities
People
- Lester S. Rubenstein
Organizations
- National Aeronautics and Space Administration