Development of an Advanced Integrated Circuit Memory Tester

Abstract

This program developed a high speed portable integrated circuit tester which can generate sophisticated memory patterns and is capable of performing in-situ diagnostics to facilitate the identification of circuit failures.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 2000
Accession Number
ADA384689

Entities

People

  • David Sleeter
  • H. J. Tausch

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies
  • Space
  • Weapons Technologies

DTIC Thesaurus Topics

  • Application-Specific Integrated Circuits
  • Army
  • Circuit Analysis
  • Circuit Testers
  • Circuits
  • Computer Programming
  • Computer Programs
  • Computers
  • Coordinate Systems
  • Databases
  • Diagrams
  • Electronics
  • Integrated Circuits
  • Military Research
  • Semiconductors
  • Solid State Electronics
  • Word Processors

Fields of Study

  • Psychology

Readers

  • Aerospace Test and Evaluation
  • Computer Engineering
  • Distributed Systems and Data Platform Development