High-Frequency Measurements and Validation of Electromagnetic Models in Scattering, Interconnects and Optoelectronics
Abstract
The performance of radio frequency (RF) integrated circuits will strongly influence the versatility and portability of future wireless communication systems. With the ever increasing demands for higher band-width and capacity as well as reductions in size weight and cost, the need for more robust and efficient RF circuits is expected to increase. Currently, millimeter-wave monolithic ICs (MMICs) chip sets are under development in the 24-94 GHz range and will represent the platform for the RF components of most wireless systems. With the recent advent of micro-electro-mechanical (MEM) systems, new potentials are being discovered for applications in the RF/millimeter wave ranges. Each of the MEM classes has produced compelling examples of working devices such as the tunable micromachined transmission line in the RF-extrinsic class, the shunt electrostatic microswitch capacitors in the RF-intrinsic class, and the capacitively coupled micromechanical resonator in the RF-reactive class.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 01, 1999
- Accession Number
- ADA385551
Entities
People
- J. E. Schutt-aine
- S. L. Chuang
- W. C. Chew
Organizations
- University of Illinois Urbana–Champaign