Simulations of the TJNAF Free Electron Laser with a Negative Taper and Laser Damage Studies

Abstract

The Free Electron Laser (FEL) is a candidate for a future close-in weapon system that will provide a longer protective range for missile destruction. The FEL is also tunable to wavelengths that would give good atmospheric transmission and optimal target absorption characteristics at the target. This thesis describes single-mode and multimode simulation results of the Thomas Jefferson National Accelerator Facility (TJNAF) FEL operating at far infrared wavelengths. The TJNAF FEL uses inverse tapering and is driven by 34.5 MeV and 47.5 MeV energy electron pulses. Steady-state power, weak-field steady state gain, electron beam energy spread and optical spectrum widths were explored as a function of the desyncinonism and tapering rate. The simulations described FEL pulse evolution and short pulse effects. The simulation results have been presented at an International Conference held at Duke University, Durham, NC in August 2000. in addition, the results of damage to Slip-cast Fused Silica samples by the TJNAF FEL, with and without the effect of airflow are analyzed. A comparison with older damage experiments was done in order to develop scaling rules in the future.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 2000
Accession Number
ADA386033

Entities

People

  • Adamantios Christodoulou

Organizations

  • Naval Postgraduate School

Tags

Communities of Interest

  • Energy and Power Technologies
  • Ground and Sea Platforms
  • Weapons Technologies

DTIC Thesaurus Topics

  • Anti-Ship Missiles
  • Directed Energy Weapons
  • Electron Beams
  • Electron Energy
  • Electrons
  • Firing Rate
  • Free Electron Lasers
  • Free Electrons
  • Laser Beams
  • Laser Mediums
  • Lasers
  • Materials
  • Optical Materials
  • Optomechanics
  • Radiation
  • Simulations
  • Steady State

Fields of Study

  • Physics

Readers

  • Pulsed Power and Plasma Physics.

Technology Areas

  • Directed Energy
  • Microelectronics