Development of a Multi-GHz Sampling Capability at the University of Maine UHF Test Facility

Abstract

The primary goal is to upgrade an existing 200 MHz high-speed ADC test facility to obtain 20 GHz test and measurement capability. The modification is required to keep abreast of developing technology in ADC design, and in particular to support an ongoing effort in the ARPA HBT/ADC program to develop multi-GHz analog-to-digital converters. Also, innovative test methodologies are being developed to characterize and diagnose distortion mechanisms for state-of-the-art converters with sample rates above 1 GHz. An important accomplishment is the development of diagnostic test procedures which may be used on fully packaged components. Normally it is not practical to probe internal points in high-speed circuits - due to loading and unloading transmission line effects - and so external diagnostic procedures are very desirable. Under this contract we have shown how phase plane error functions can be built and interpreted to estimate specific ADC architecture effects. Additionally, this work has shown that the same set of calibration data can be used to estimate different features through the appropriate choices of basis functions related to specific ADC architectures. Fast Orthogonal Search methods were developed to assist in the selection of the most sensitive error basis functions.

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Document Details

Document Type
Technical Report
Publication Date
Feb 19, 2001
Accession Number
ADA388404

Entities

People

  • Donald M. Hummels
  • Fred Irons

Organizations

  • University of Maine

Tags

Communities of Interest

  • Energy and Power Technologies
  • Ground and Sea Platforms
  • Human Systems
  • Materials and Manufacturing Processes

DTIC Thesaurus Topics

  • Algorithms
  • Application Software
  • C Programming Language
  • Calibration
  • Chromosomes
  • Computer Networks
  • Computer Programming
  • Databases
  • Information Science
  • Measurement
  • Military Research
  • Pattern Recognition
  • Sampling
  • Test Equipment
  • Test Facilities
  • Two Dimensional
  • Waveforms

Readers

  • Approximation Theory.
  • Integrated Circuit Design and Technology.
  • Systems Analysis and Design