Parametric Study of Propagation in Evaporation Ducting and Subrefractive Conditions
Abstract
This report quantifies propagation loss differences that result from approximating the full stability-dependent refractivity profiles with neutral-stability profiles parameterized by duct height. It also develops a parameterization for subrefractive profiles and quantifies the propagation loss differences that result from approximating the full stability-dependent refractivity profiles with neutral-stability profiles parameterized by subrefractive layer height.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 2000
- Accession Number
- ADA388456
Entities
People
- R. A. Paulus
Organizations
- Naval Information Warfare Systems Command