X-Ray Measurements With Films Masked by Staggered Absorption Layers of Aluminum

Abstract

A technique for measuring x-ray emissions within the photon energy range 1 keV to 10 keV is described. A staggered set of aluminum absorbers, supported by kimfoil, is used to mask x-ray-sensitive film. Response functions of aluminum and kimfoil absorbers, along with the response function of the film, provide reasonable energy discrimination. Integrated incident energy along with modest spectral resolution may be obtained by convolution of the transmission of x-rays through the aluminum absorber stack and the exposed film density. Synthetic and experimental data are presented. For discrete photon energies, within the range noted, at least (plus an minus 0.5 keV resolution is realized.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 1997
Accession Number
ADA388665

Entities

People

  • James H. Degnan
  • Sue E. Englert
  • Thad J. Englert

Organizations

  • Air Force Research Laboratory

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Absorption
  • Absorption Coefficients
  • Air Force
  • Air Force Facilities
  • Air Force Research Laboratories
  • Aluminum
  • Coefficients
  • Directed Energy Weapons
  • Discrimination
  • Experimental Data
  • Government Procurement
  • Governments
  • Materials
  • Measurement
  • Radiation
  • Thickness
  • X Rays

Fields of Study

  • Physics

Readers

  • Nanofabrication and Microfabrication.
  • Nuclear and Radiation Engineering.
  • Pulsed Power and Plasma Physics.