Characterization of Semi-Insulating InP Wafers by Scanning Luminescence (SPL), Scanning Photocurrent (SPC) and Cathodoluminescence (CL). Study of the Wafer Homogeneity

Abstract

This report results from a contract tasking Universidad of Valladolid as follows: The contractor will investigate the distribution of iron in InP wafers using the techniques of scanning photoluminescence and scanning photocurrent.

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Document Details

Document Type
Technical Report
Publication Date
Oct 01, 2000
Accession Number
ADA389319

Entities

People

  • Juan J. Lopez

Organizations

  • University of Valladolid

Tags

DTIC Thesaurus Topics

  • Boundaries
  • Carrier Mobility
  • Cathodoluminescence
  • Crystal Defects
  • Crystals
  • Electrical Properties
  • Electrons
  • Energy Bands
  • High Resolution
  • Homogeneity
  • Laser Beams
  • Luminescence
  • Materials
  • Materials Science
  • Measurement
  • Microscopes
  • Temperature Gradients

Fields of Study

  • Materials science

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Semiconductor Device Technology
  • Technical Research and Report Writing.

Technology Areas

  • Microelectronics