MOVPE Reactor for Deposition of Wide Band Gap Semiconductors

Abstract

A metalorganic vapor phase epitaxy reactor was constructed to study the epitaxy of BxGa1-xN and BxAl1-xN on 6H-SiC substrates. The solubility of boron in AlN and GaN was shown experimentally to be very low, less than 3 at %. This low solubility of boron in the group III nitrides was consistent with thermodynamic arguments based on the structure of the binary compounds involved. Adding boron to GaN increased its energy band gap up to the point of two phases forming. Unfortunately, even small additions of diborane greatly reduced the growth rate (at 1000 degrees Celsius) and the crystal quality of the deposits. This furnace is continuing to be used to study the epitaxy of GaN and AlN.

Open PDF

Document Details

Document Type
Technical Report
Publication Date
Apr 20, 2001
Accession Number
ADA389584

Entities

People

  • James H Edgar

Organizations

  • Kansas State University

Tags

Communities of Interest

  • Advanced Electronics
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Aluminum Nitrides
  • Band Gaps
  • Ceramic Materials
  • Compound Semiconductors
  • Elements
  • Energy Bands
  • Epitaxial Growth
  • Films
  • Gallium Nitrides
  • Materials
  • Nitrides
  • Phase
  • Semiconductors
  • Silicon Carbide
  • Solubility
  • Thin Films
  • Vapor Phases

Fields of Study

  • Materials science

Readers

  • Semiconductor Device Technology
  • Surface Engineering/Surface Coating Technology.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene