Nonlinear Microwave Power and Noise Measurement and Analysis Facility

Abstract

Under the support of this finding, UCLA are able to setup a complete high quality microwave power measurement system. Currently, this is the only system available in UCLA to perform on wafer automatic load pull measurement. Measurable frequency covers from 4 GHz to 18 GHz, driven power up to 20 Watts. By adding the noise equipment and sharing some equipment in this system, the system can perform low noise measurement. About ten technique papers have been published relating to this system so far.

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Document Details

Document Type
Technical Report
Publication Date
Nov 30, 2000
Accession Number
ADA390866

Entities

People

  • Kang L. Wang

Organizations

  • University of California, Los Angeles

Tags

Communities of Interest

  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Amplifiers
  • Automatic
  • Electrical Engineering
  • Field Effect Transistors
  • Frequency
  • Generators
  • Low Noise
  • Measurement
  • Microwaves
  • Noise
  • Power Amplifiers
  • Power Measurement
  • Power Supplies
  • Signal Generators
  • Spectrum Analyzers
  • Transistors
  • X Band

Fields of Study

  • Physics

Readers

  • Optical Physics and Photonics.
  • Systems Analysis and Design
  • Technical Research and Report Writing.