Optical Diagnostics Systems Supplementing Integrated Materials Processing Facility of Major University Research Initiative

Abstract

As part of the DoD-MURI research program entitled 'Modeling and control of Advanced Chemical Vapor Deposition Processes: the Control of Defects in Mixed III-V Compound Semiconductors' (Grant F49620-95-1-0447), DURIP funding was provided to establish a real-time optical characterization facility to study thin-film growth processes extended to super-atmospheric pressures. The extension of the chemical vapor deposition (CVD) to operating conditions at super-atmospheric pressures mandated validation of: (a) Simulations of surface reaction kinetics; (b) Simulations of homogeneous gas phase reactions coupled to transport in laminar high density vapor flows; and (c) the development of experimental methods for the detection of onset of turbulence, that is, verification of laminar flow under conditions of high pressure OMCVD.

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Document Details

Document Type
Technical Report
Publication Date
May 25, 2001
Accession Number
ADA391292

Entities

People

  • H. Thomas Banks
  • K. J. Bachmann
  • N. Dietz

Organizations

  • North Carolina State University

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Barometric Pressure
  • Chemical Kinetics
  • Chemical Vapor Deposition
  • Compound Semiconductors
  • Detection
  • Films
  • Flow
  • High Density
  • High Pressure
  • Laminar Flow
  • Materials
  • Materials Processing
  • Simulations
  • Spectroscopy
  • Surface Reactions
  • Thin Films
  • Vapor Deposition

Readers

  • Fluid Mechanics and Fluid Dynamics.
  • Research Science/Academic Research
  • Semiconductor Device Technology

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene