Langmuir Probe Measurement Techniques and Data Analysis for LAPPS
Abstract
Langmuir probe diagnostics have been applied to an inductively coupled test discharge as part of the diagnostics development effort for the Large Area Plasma Processing System at NRL. The method of calculating electron energy from the EEDF derived from the probe second derivative is compared with more traditional methods of fitting the probe characteristics to a known function assuming a Maxwellian distribution. It is shown that under some circumstances the local plasma around the probe can be perturbed such that fewer electrons are sourced to the probe than theory would predict for a non-perturbing diagnostic, resulting in a higher average electron energy.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jun 11, 2001
- Accession Number
- ADA391704
Entities
People
- D. D. Blackwell
- D. Leonhardt
- Richard F. Fernsler
- Scott G. Walton
Organizations
- United States Naval Research Laboratory