Nanoworkbench for Analysis, Manipulation, and Excitation of Individual Nanostructures

Abstract

A unique experimental device, the Nanoworkbench, has been constructed and is being extensively tested at present. This device involves 4 independent STM tips which may be imaged by an SEM in order to locate their relative positions. These 4 STM probes will be used to make 4-point probe electrical conductivity measurements on nanometer objects. In addition, provision is made for Auger spectroscopy measurements on individual 10 nm objects which are being probed by the STMs. The instrument works in a number of initial tests. Preliminary examples of tests and measurements with this instrument are included in this report.

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Document Details

Document Type
Technical Report
Publication Date
Aug 06, 2001
Accession Number
ADA393473

Entities

People

  • Joachim Ahner
  • John Yates

Organizations

  • University of Pittsburgh

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Carbon Nanotubes
  • Chemistry
  • Eddy Currents
  • Electrical Conductivity
  • Electrical Properties
  • Frequency
  • Fullerenes
  • Materials
  • Materials Laboratories
  • Materials Science
  • Measurement
  • Molecules
  • Nanotechnology
  • Optical Properties
  • Quantum Dots
  • Resonant Frequency
  • Vibration

Readers

  • Aerospace Test and Evaluation
  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Microelectromechanical Systems