A High Temperature Microhardness Tester for Structural Ceramics

Abstract

The grant was initiated on May 1, 1999. In view of the fact that high temperature microindentation testers are no longer in commercial production, we have instead designed, purchased and received an atomic force microscope (AFM) from Digital Instrument. This instrument is configured to perform nanoindentation tests to obtain information on deformation resistance in both elastic and plastic range. The instrument was installed in September 1999 and personnel have been trained to operate the instrument at the same time. We have proceeded with nanomechanical characterization of the bulk silicon nitride and SiAlON's and their interfacial properties. This includes a study of the intergranular glassy phase that is often thought to be a critical factor in determining their mechanical performance.

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Document Details

Document Type
Technical Report
Publication Date
Jul 01, 2001
Accession Number
ADA393567

Entities

People

  • I-wei Chen

Organizations

  • University of Pennsylvania

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Air Force
  • Ceramic Materials
  • Cutting Tools
  • Hardness
  • High Temperature
  • Materials
  • Materials Science
  • Mechanical Properties
  • Microhardness
  • Microscopes
  • Phase Transformations
  • Physical Chemistry
  • Resistance
  • Silicon Carbide
  • Statistics
  • Structural Ceramics

Readers

  • Materials Science and Engineering.
  • Nanoscale Plasmonic Nanotechnology
  • Software Engineering