Study of Polydispersity of Grafted Poly(dimethylsiloxane) Surfaces Using Single Molecule Atomic Force Microscopy

Abstract

Single molecule atomic force microscopy (AFM) was used to study the statistical distribution of contour lengths (polydispersity) of polymer chains grafted to a surface. A poly(dimethylsiloxane) (PDMS) monolayer was grafted on a flat silicon substrate by covalently bonding Cl-terminated PDMS to an OH-silicon surface and characterized using contact angle measurements and ellipsometry, and single molecule AFM. A model for the single chain dynamics is presented. The statistical distributions of the polymer contour lengths were found to depend on concentration of the PDMS polymer used in the grafting solutions.

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Document Details

Document Type
Technical Report
Publication Date
Jan 01, 2000
Accession Number
ADA393686

Entities

People

  • Graham C. Walker
  • J. Bemis
  • S. Al-mawaali

Organizations

  • University of Pittsburgh

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  • Abstracts
  • Chemistry
  • Free Radicals
  • Gel Permeation Chromatography
  • Governments
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  • Molecular Weight
  • Molecules
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Fields of Study

  • Physics

Readers

  • Polymer Science and Technology
  • Thin Film Deposition Science.