Grain Boundary Chemistry and Creep Resistance of Alumina

Abstract

The Lehigh group has pioneered work on the role of segregating rare earth dopants on the grain boundary structure and tensile creep behavior of alumina. In an attempt to clarify the exact mechanism that controls creep behavior of the doped aluminas, various advanced characterization techniques have been applied including: secondary ion mass spectrometry (SIMS), scanning transmission electron microscopy (STEM), orientation image microscopy (OIM), x-ray absorption studies which include x-ray absorption near edge structure (XANES) and extended x-ray absorption fine structure (EXAFS), and atomistic computer simulation and studies of the creep kinetics. Combined use of high resolution STEM and EXAFS allowed the determination of the dopant grain boundary segregation behavior and the atomic structural environment around the grain boundary segregated dopant ions.

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Document Details

Document Type
Technical Report
Publication Date
Mar 01, 2001
Accession Number
ADA394927

Entities

People

  • Helen M. Chan
  • Jeffrey M. Rickman
  • Martin P Harmer

Organizations

  • Lehigh University

Tags

Communities of Interest

  • Air Platforms
  • Energy and Power Technologies

DTIC Thesaurus Topics

  • Air Force
  • Ceramic Materials
  • Chemical Analysis
  • Chemical Synthesis
  • Chemistry
  • Data Analysis
  • Electron Microscopy
  • Mass Spectrometry
  • Materials
  • Materials Processing
  • Materials Science
  • Materials Testing
  • Measurement
  • Point Defects
  • Spectra
  • Spectrometry
  • Spectroscopy

Fields of Study

  • Materials science
  • Physics

Readers

  • Materials Science and Engineering.
  • Powder metallurgy of Titanium alloys.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics