Scanning Probe Microscope for the Analysis of Thermal and Electrical Properties of Nanolaminates

Abstract

Funding of $144,540 was received for the purchase of a special scanning probe microscope (SPM) through the Defense University Research Instrumentation Program (DURIP). These funds were used to purchase a new SPM and related hardware for the analysis of nanolaminate thin films. An AutoProbe CP SPM was purchased from Thermomicroscopes in Sunnyvale, California for $121,499. A Dektak3 Surface Profiler was also purchased from Veeco Metrology Group in Santa Barbara, California for $23,041. The instrumentation was received and installed and have been giving excellent results. This new instrumentation has significantly impacted our AFOSR-sponsored research and research-related education. The SPM and surface profilometer have greatly enhanced our ability to characterize the properties of nanolaminate thin films.

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Document Details

Document Type
Technical Report
Publication Date
Oct 22, 2001
Accession Number
ADA396786

Entities

People

  • Steven M. George

Organizations

  • University of Colorado Boulder

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Barrier Coatings
  • Chemistry
  • Education
  • Electrical Properties
  • Films
  • Instrumentation
  • Measurement
  • Microscopes
  • Optics
  • Optoelectronics
  • Photonics
  • Scanning
  • Students
  • Surface Chemistry
  • Surface Roughness
  • Thermal Conductivity
  • Thin Films

Readers

  • Nanoscale Plasmonic Nanotechnology
  • Research Science/Academic Research
  • Thin Film Deposition Science.