Generation of Large-Area, Crack-Free GaN Layers on Si Substrates

Abstract

The development of truly compliant layers, compatible with Si-based tooling, was investigated for the growth of GaN on a Si substrate. For this project, thin Si layers were fabricated on a metal bonding layers. The metal bonding medium was chosen such that it would be liquid at the GaN growth temperature and hence be compliant, allowing lateral motion of the Si template layer as growth proceeded and during the cooling of the grown structure from the growth temperature. The stability of thin Si substrate layer during thermal cycling was determined both experimentally and through modeling. Constraints on the formation of metal bonded structures based on the interplay of the elastic strain energy and bond energy of a template/DB multi-layer structure supported on a metal layer were developed.

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Document Details

Document Type
Technical Report
Publication Date
Dec 01, 2001
Accession Number
ADA397736

Entities

People

  • Thomas F Kuech

Organizations

  • University of Wisconsin–Madison

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Chemical Engineering
  • Chemical Vapor Deposition
  • Crystal Growth
  • Curvature
  • Demographic Cohorts
  • Engineering
  • Epitaxial Growth
  • Equations
  • Films
  • Materials
  • Melting Point
  • Phase Transformations
  • Semiconductors
  • Silicon Carbide
  • Substrates
  • Template Patterns
  • Transition Temperature

Fields of Study

  • Engineering
  • Materials science

Readers

  • Semiconductor Device Technology