Radiation Sources for Total-Dose Testing of Electronics
Abstract
Two Shepherd Model 89 cesium-137 gamma-ray irradiators were acquired and installed at Vanderbilt University. Safety inspections were performed and appropriate monitoring equipment was put in place. The sources provide capability for irradiating electronic devices at relatively - low dose rates, which is important for understanding important device-level degradation effects, including the Enhanced Low-Dose-Rate Sensitivity (ELDRS) of bipolar integrated circuits and long-term degradation and in-situ annealing of MOS integrated circuits.
Document Details
- Document Type
- Technical Report
- Publication Date
- Feb 20, 2002
- Accession Number
- ADA399705
Entities
People
- Ronald D. Schrimpf
Organizations
- Vanderbilt University