Probing Thin Film Thermophysical Properties Using the Femtosecond Transient ThermoReflectance Technique

Abstract

The objectives are as follows: Discuss Femtosecond Transient ThermoReflectance (FTTR) technique as a method for measuring the thermophysical properties of thin film materials. Demonstrate the measurement of the thermal diffusivity, electron-phonon coupling factor, and thermal boundary resistance of thin metallic films using the FTTR technique. Discuss the importance of considering the nonlinear relationship between reflectance and temperature. Present experimental results for Femtosecond Transient ThermoTransmittance (FTTT) studies performed on amorphous silicon solar cells.

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Document Details

Document Type
Technical Report
Publication Date
May 30, 2001
Accession Number
ADA400310

Entities

People

  • Pamela M. Norris

Organizations

  • University of Virginia

Tags

Communities of Interest

  • Advanced Electronics

DTIC Thesaurus Topics

  • Band Structures
  • Boundaries
  • Diffusivity
  • Electrons
  • Energy Bands
  • Films
  • Heat Transfer
  • Laser Pulses
  • Materials
  • Measurement
  • Reflectance
  • Scattering
  • Solar Cells
  • Thermal Conductivity
  • Thermal Diffusivity
  • Thermophysical Properties
  • Thin Films

Fields of Study

  • Physics

Readers

  • Quantum Dot Semiconductor Device Photonics and Graphene Optoelectronic Materials and THz Physics.
  • Thermal Physics or Thermal Science.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene