International Conference on Defects - Recognition, Imaging and Physics in Semiconductors (9th) (DRIP IX) Held in Rimini, Italy on September 24-28, 2001. Program and Abstracts
Abstract
Conference topics included: Photoluminescence, Other optical methods, Nanoscanning techniques, Defects in silicon, contactless techniques, Electron beam methods, Electrical methods, Defects in wide-gap semiconductors, cathodoluminescence, X-ray techniques, Miscellaneous techniques and Defects in devices.
Document Details
- Document Type
- Technical Report
- Publication Date
- Sep 01, 2001
- Accession Number
- ADA400330