Effects of Shot-Peening on High Cycle Fretting Fatigue Behavior of Ti-6Al-4V

Abstract

Effects of Shot-peening on High Cycle Fretting Fatigue behavior of Ti-6Al-4V were investigated. Experiments were performed with 6.35 mm thick specimens which provided S/N curves. After the tests, it was observed that the specimens failed near the trailing edge of contact. Scanning Electron Microscopy showed that cracks initiated on the contact surface for 6.35 mm, and at the depth of specimen ranging from 200 to 300 microns for 3.81 mm thick specimens. Initial crack orientation was around 37 and 42 degrees respectively for 6.35 and 3.81 mm thicknesses. Finite Element Analysis (FEA) was conducted, and using FEA results, Smith-Watson-Topper, Findley, Shear Stress Range and Modified Shear Stress Range parameters were evaluated. Stress relaxation was observed after the failure of the specimens, and evaluations were repeated for different percentages of stress relaxation. Based on specific assumptions about stress relaxation. Modified Shear Stress range parameter was determined to be the only appropriate fatigue parameter that could meet all the required conditions for shot-peened fretting fatigue specimens. Also thickness effects on shot-peened specimens were investigated and discussed in this study.

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Document Details

Document Type
Technical Report
Publication Date
Mar 26, 2002
Accession Number
ADA401223

Entities

People

  • Halil I. Yuksel

Organizations

  • Air Force Institute of Technology

Tags

Communities of Interest

  • Air Platforms
  • C4I

DTIC Thesaurus Topics

  • Air Force
  • Air Force Research Laboratories
  • Cold Working
  • Electron Microscopy
  • Finite Element Analysis
  • Fracture (Mechanics)
  • Geometry
  • Materials
  • Mechanical Properties
  • Mechanical Working
  • Mechanics
  • Microscopy
  • Scanning Electron Microscopy
  • Shear Stresses
  • Shot Peening
  • Stresses
  • Trailing Edges

Fields of Study

  • Materials science

Readers

  • Materials Science (Mechanical Engineering).
  • Psychological Intervention/Treatment for Stress, Anxiety, PTSD, and Related Emotional and Cognitive Health Symptoms.

Technology Areas

  • Microelectronics