Stress Synergy in Proton Induced Single Event Effects in SRAM
Abstract
A study was conducted to determine the effect of prior exposure to radiation on the proton-induced single event effect (SEE) cross section for SRAM devices. This was done in order to determine whether or not proton testing of virgin parts accurately determines the likely rate of single event effects for these parts in a space environment. Two types of SRAM parts were exposed to various doses of gamma radiation and then tested with identical proton irradiations to determine their SEE cross sections. The results of these experiments were analyzed to determine the expected number of SEE events for these devices in typical space radiation environments, including the radiation environment of RADARSAT II. Both types of SRAM chips showed an increase in the SEE rate with prior radiation exposure. One type of SRAM, the D431000ACZ-70L, showed such a dramatic increase in the SEE rate that early failure in a satellite mission due to natural radiation, or in the event of an exo-atmospheric nuclear detonation, is likely.
Document Details
- Document Type
- Technical Report
- Publication Date
- Nov 01, 2001
- Accession Number
- ADA403863
Entities
People
- D. Estan
- L. S. Erhardt
- Thomas Cousins
Organizations
- Defence Research and Development Canada