Acquisition of an X-ray Diffractometer for Nanotechnology Research

Abstract

The objective of this project was to acquire a X-ray diffraction spectrometer for the study of nanomaterials. In a current project supported by the Air Force Office of Sponsored Research, the WKU Materials Characterization Center (MCC) is conducting research on polymer/clay nanocomposites, with the intent of gaining a better understanding of the relationship between processing and the microstructure properties of the nanomaterials. The Center plans to use its current holdings and projects to establish a Nanomaterials Research Laboratory. Prior to this project, the available instrumentation included atomic force microscopy/Micro-TA, scanning electron microscopy, and transmission electron microscopy. However, these instruments can not provide all the necessary information for current and proposed projects, and there was a pressing need for an x-ray diffraction (XRD) system for microstructure analysis of nanocomposites.

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Document Details

Document Type
Technical Report
Publication Date
Apr 01, 2002
Accession Number
ADA404860

Entities

People

  • John T. Riley
  • Wei-ping Pan

Organizations

  • Western Kentucky University

Tags

DTIC Thesaurus Topics

  • Air Force
  • Chemistry
  • Detectors
  • Diffraction
  • Diffractometers
  • Electron Microscopy
  • High Temperature
  • Instrumentation
  • Materials
  • Microscopy
  • Microstructure
  • Nanocomposites
  • Nanomaterials
  • Scanning Electron Microscopy
  • Transmission Electron Microscopy
  • X Rays
  • X-Ray Diffraction

Fields of Study

  • Materials science

Readers

  • Materials Science and Engineering.
  • Nanoscale Plasmonic Nanotechnology
  • Technical Research and Report Writing.

Technology Areas

  • Biotechnology
  • Microelectronics