The Use of the Electron Probe Microanalyzer in Materials Research and Development

Abstract

The electron probe microanalyzer, a versatile tool for the analysis of areas as small as one micron in diameter, has been used at Goddard Space Flight Center in applications ranging from materials research to analysis of failures in mechanical parts. Methods of using the probe and representative results obtained are illustrated by several examples that include bonding of thermoelectric materials, alloy development, and analysis of materials failure.

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Document Details

Document Type
Technical Report
Publication Date
Jun 01, 1968
Accession Number
ADA405715

Entities

People

  • Lawrence Kobren

Organizations

  • National Aeronautics and Space Administration

Tags

Communities of Interest

  • Advanced Electronics
  • Space

DTIC Thesaurus Topics

  • Aeronautics
  • Alloys
  • Aluminum Alloys
  • Carbides
  • Chemistry
  • Electron Beams
  • Electron Probes
  • Elements
  • Flight
  • Heat Treatment
  • Intermetallic Compounds
  • Materials
  • Materials Engineering
  • Melting Point
  • Space Flight
  • United States
  • X Rays

Readers

  • Plasma Physics.
  • Surface Engineering/Surface Coating Technology.
  • Systems Analysis and Design

Technology Areas

  • Microelectronics
  • Space
  • Space - Hall-Effect Thruster