HEDM Source Characterization by Multi-Photon Ionization Time-of-Flight Mass Spectrometry
Abstract
We present results obtained using an apparatus designed to characterize the species produced by a variety of HEDM sources. In this apparatus, the HEDM species are ionized by a pulsed excimer laser beam and analyzed by time-of-flight mass spectrometry. Complications arising from photofragmentation vs. photoionization were encountered and documented as a function of ionization wavelength and intensity.
Document Details
- Document Type
- Technical Report
- Publication Date
- May 01, 1999
- Accession Number
- ADA408654
Entities
People
- Mario E. Fajardo
- Michelle E. Derose
Organizations
- Air Force Research Laboratory