Low Frequency Noise Characterization System of Advanced Electronics Devices
Abstract
To date, a rising need for high-speed low-noise electronic devices is observed for a wide variety of applications, including wireless or fiber communications. Low frequency noise poses a lower limit on the signal level in broadband circuits. Noise sources are related to various kinds of materials imperfections such as point or line defects, but also to interface interface defects or defects at contacts. As device dimensions decrease, the noise introduced by trapping-detrapping of carriers at deep defects becomes increasingly important. Therefore, the analysis of low frequency electrical noise can be a useful tool not only for the qualification of device performance, but also for the characterization of noise-generating deep level defects in semiconductor materials. The advantages of this technique include the possibility of measuring fully processed device structures and the direct relevance of the measured defect characteristics to device performance Reduction of the noise level frequently requires the correct identification of noise sources. However, difficulties can arise in the interpretation of often-indistinct noise spectrum features.
Document Details
- Document Type
- Technical Report
- Publication Date
- Dec 16, 2002
- Accession Number
- ADA410813
Entities
People
- Eicke Weber
- Petra Specht
Organizations
- University of California, Berkeley