In-Situ Single DNA Manipulation with phi 20nm Electron-Beam-Deposited Probe

Abstract

This paper proposes a novel DNA-sequencing- preprocessing that can selectively extract a specific part of a single molecular DNA fiber by in-situ manipulation. The in-situ manipulation extends DNA fibers on a glass substrate, cuts into several DNA fragments, and isolates a specific DNA fragment. In this method full-time observation of the manipulation is provided for the purpose of keeping the information about where the isolated DNA fragment used to he located in the original DNA fiber. A hook-shaped phi 20 nm probe was fabricated by Electron-Beam-Deposition for isolating the DNA fragment. With this probe, the DNA fragment, extended on the surface of water-repellent with its end anchored by An colloid, was hooked and lifted up from the glass substrate; water-repellent has an effect of preventing adsorption between the DNA fragment and the glass substrate. Finally, the specific DNA fragment was successfully isolated onto a new clean glass substrate.

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Document Details

Document Type
Technical Report
Publication Date
Oct 25, 2001
Accession Number
ADA411368

Entities

People

  • Masayuki Nakao
  • Sota Fujioka
  • Takeshi Ooi

Organizations

  • University of Tokyo

Tags

DTIC Thesaurus Topics

  • Abstracts
  • Chain Reactions
  • Chemical Reactions
  • Chromosomes
  • Contamination
  • Dna Microarrays
  • Dna Sequence Analysis
  • Electric Fields
  • Electron Beams
  • Electrons
  • Engineering
  • Genome
  • Human Genome
  • Laser Beams
  • Microscopes
  • Preprocessing
  • Substrates

Readers

  • Nanofabrication and Microfabrication.
  • Optical Fiber Sensing and Electromagnetic Propagation.
  • Surface Coatings Technology.

Technology Areas

  • Directed Energy
  • Directed Energy - Pulsed-Laser Deposition
  • Microelectronics
  • Microelectronics - Graphene