Optoelectronic Integrated Circuits Fabricated Using Atomic Layer Epitaxy
Abstract
Atomic Layer Epitaxy (ALE) is studied for use in the fabrication of optoelectronics integrated circuits, A new approach to ALE is investigated in which the process is performed under UHV conditions using organometallic compounds a sources for the reactive species. A vacuum ALE system was constructed and the mechanisms for growth of GaAs using trimethylgallium (TMGa) and tertiarybutylarsine (TBAs) were investigated using a set of in situ tools - reflection difference spectroscopy, mass spectroscopy, and reflection high energy electron diffraction. Studies of the interplay of total growth rate and background impurity (Carbon) incorporation were investigated. The growth rate was found to be limited by the exposure time required to insure complete removal of the CH3 species from the surface to reduce C incorporation. Selective area growth of GaAs on patterned substrates was undertaken to investigate the orientation dependences of the growth morphology on pattern direction.
Document Details
- Document Type
- Technical Report
- Publication Date
- Jul 01, 1995
- Accession Number
- ADA411541
Entities
People
- Paul Daniel Dapkus
Organizations
- University of Southern California