Materials Characterization by Atomic Force Microscopy

Abstract

This research program is focused on the study of the atomic force microscope (AFM) as an instrument for quantitative measuring and imaging material properties with nanoscale resolution. More specific to this research are the dynamic modes of AFM, in which the specimen moves relative to the AFM cantilever tip while in contact. Particular emphases include the higher-order vibration modes and the nonlinear vibration response. In addition to the original objective, improved modeling of AFM cantilevers has been undertaken. The use of simplified beam models with uniform cross section does not reflect the AFM cantilevers that are often used in experiments. High resolution cantilever measurements with a scanning electron microscope (SEM) and modeling with finite element analysis have been used to improve the comparisons between experiments and numerical models.

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Document Details

Document Type
Technical Report
Publication Date
Apr 14, 2003
Accession Number
ADA414116

Entities

People

  • Joseph A. Turner

Organizations

  • University of Nebraska–Lincoln

Tags

Communities of Interest

  • Advanced Electronics
  • Biomedical
  • Sensors

DTIC Thesaurus Topics

  • Air Force
  • Crystal Structure
  • Elastic Properties
  • Finite Element Analysis
  • Frequency
  • Frequency Shift
  • Geometry
  • Materials
  • Measurement
  • Mechanical Properties
  • Mechanics
  • Microelectromechanical Systems
  • Microscopy
  • Modulus Of Elasticity
  • Resonant Frequency
  • Stiffness
  • Vibration

Readers

  • Computational Modeling and Simulation
  • Structural Dynamics.
  • Thin Film Deposition Science.

Technology Areas

  • Microelectronics
  • Microelectronics - Graphene
  • Microelectronics - Microelectromechanical Systems